|
Division Overview
Division Organization
Sources, Detectors and Displays Group
Optical Fiber and Components Group
Optoelectronics Manufacturing Group
Staff Directory
Employment
Opportunities
How to
Contact Us
Optoelectronics Division (815.00) National Institute of
Standards and Technology 325 Broadway Boulder, CO
80305-3328
Directions
Phone: (303)
497-5342 FAX: (303) 497-7671, -3387
For information on other federal programs, see

NIST is an agency of
the U.S.
Department of Commerce
Disclaimer
Privacy
Statement/Security Notice
FOIA
Page updated: 05/05/2008 |
Adobe Acrobat Reader (version 4.0x or greater) will be needed to view many of these documents. If you do not have this program, you may download it free of charge. The software is identified in order to assist users of this information service. In no case does such identification imply recommendation or endorsement by the National Institute of Standards and Technology. |
January 2008 |
EEEL improves high-speed
waveform calibrations
Researchers in EEEL and ITL have developed and validated a covariance-based uncertainty analysis for NIST's electro-optic sampling (EOS) system, which provides calibrated results for both time- and frequency-domain electronic instruments. With this EOS system, NIST presently offers photodiode calibrations to 110 GHz. The electrical response of the photodiodes is determined in the frequency domain, and the measured spectrum and phase of the photodiode's electrical output makes the NIST-calibrated photodiodes ideal for calibrating a variety of other electrical frequency-domain instruments, such as lightwave component analyzers and large-signal analyzers.
Click here for more information about high-speed waveform calibrations. |
February 2008 |
EEEL Researcher Receives
Allen V. Astin Award
Igor Vayshenker, Calibration Leader of the EEEL Optical Fiber Power Laboratory, recently received the Allen V. Astin Award, which is given annually to recognize outstanding achievement in the advancement of measurement science. Mr. Vayshenker was recognized for his leadership in developing and providing modern standards and measurement services for optical fiber power.
Click here for more information about the depth of Vayshenker's work.
|
|
EEEL Researchers Receive FLC Award for
Excellence in Technology Transfer
EEEL Researchers Chris Cromer, John Lehman, and Xiaoyu Li have received the 2008 Award for Excellence in Technology Transfer by the Federal Laboratory Consortium for Technology Transfer (FLC). The FLC award recognizes federal laboratory employees who have accomplished outstanding work in the process of transferring a technology to the commercial marketplace. Cromer, Lehman, and Li were recognized for their pioneering work in commercializing optical trap detectors for laser power measurements.
Click here for more information about the technology transfer work.
|
|
|
|