About the
Presenter: During
his five years with NI, Will has consulted with
customers in a wide variety of industries
on the specification, design, and implementation of their test and
control
systems. Will was born and raised in
Colorado, and he graduated from the University of Colorado in Boulder
with a
bachelor’s degree in mechanical
engineering and a minor in computer science. After graduation, he spent
two
years working in the NI Applications
Engineering Group in Austin, Texas, where he developed an in-depth
knowledge of
the National Instruments Data
Acquisition products.
Session Description: National Instruments has been a industry leader in developing software defined hardware
About the
Presenter: During
his five years with NI, Will has consulted with
customers in a wide variety of industries
on the specification, design, and implementation of their test and
control
systems. Will was born and raised in
Colorado, and he graduated from the University of Colorado in Boulder
with a
bachelor’s degree in mechanical
engineering and a minor in computer science. After graduation, he spent
two
years working in the NI Applications
Engineering Group in Austin, Texas, where he developed an in-depth
knowledge of
the National Instruments Data
Acquisition products.
Presented by Will Denman of National Instruments
Date: Tuesday, March 31, 2009
Location: Building 1, Room 1-4552
Time: 9:00
AM to 10:30 AM
Session
Description: One of the primary
uses for National Instruments products is to automate the testing of
a
device. For some designs it is simple to design this type of test
architecture from scratch with a programming
language like LabVIEW, CVI, VB or .NET. However as the test complexity
increases it becomes more cumbersome
and expensive to maintain a home grown framework. We have worked with
many customers to provide
architectures for their tests and we have also developed some powerful
software tools such as NI-TestStand to
reduce the cost of automated test. During this session we will
investigate the various aspects of a test executive
and the amount of effort required to develop each of these components
from scratch.
Pre-Session Readings:
Designing
Next-Generation Test Systems
http://digital.ni.com/express.nsf/bycode/ateguide
What is NI TestStand?
http://zone.ni.com/devzone/cda/tut/p/id/6073
Product Information:
National
Instruments TestStand
http://www.ni.com/teststand/
About the
Presenter: During
his five years with NI, Will has consulted with
customers in a wide variety of industries
on the specification, design, and implementation of their test and
control
systems. Will was born and raised in
Colorado, and he graduated from the University of Colorado in Boulder
with a
bachelor’s degree in mechanical
engineering and a minor in computer science. After graduation, he spent
two
years working in the NI Applications
Engineering Group in Austin, Texas, where he developed an in-depth
knowledge of
the National Instruments Data
Acquisition products.
Presented by Will Denman of National Instruments
Date: Tuesday, February 10, 2009
Location: Building 1, Room 1-4552
Time: 9:00 AM
to
10:30 AM
Session Description:
In the last few years, several trends and
technologies have emerged to significantly impact the
evolution of PC-based DAQ. New bus technologies such as USB and Wi-Fi
have
improved both ease-of-use and
flexibility. New semiconductor technologies have enabled additional
signal
conditioning and isolation features to be
integrated into devices. FPGAs have been incorporated to enable custom
timing
and triggering hardware
functionality as well as onboard signal processing, and hardware and
software
innovations have enabled advanced
timing and synchronization solutions. In this session we explore these
new
technologies and how to take advantage
of them through National Instruments Data Acquisition hardware.
Pre-Session
Readings:
Tips and Techniques in Data Acquisition Triggering -
NI-DAQmx
http://zone.ni.com/devzone/cda/tut/p/id/4329
Timing and Synchronization Features of NI-DAQmx
http://zone.ni.com/devzone/cda/tut/p/id/4322
Product
Information:
National Instruments Data Acquisition Products
http://www.ni.com/daq
About the
Presenter: During his five years with NI, Will has
consulted with
customers in a wide variety of industries
on the specification, design, and implementation of their test and
control
systems. Will was born and raised in
Colorado, and he graduated from the University of Colorado in Boulder
with a
bachelor’s degree in mechanical
engineering and a minor in computer science. After graduation, he spent
two
years working in the NI Applications
Engineering Group in Austin, Texas, where he developed an in-depth
knowledge of
the National Instruments Data
Acquisition products.
Date: Thursday, February
12, 2009 - 9:00 am to 11:45 am
Location: NIST Building 1,
Room
1-4552
Demo Stations:
Trigger
Scanning: LeCroy
uses high-speed hardware
triggering capability with persistence displays to capture only the
signals of
interest and provide answers up to 100x
faster than
other methods.
WaveScan: Advanced Search
Tool finds
unusual events. Finds problems that triggers won't
find.
Fast processing aids analysis. Advanced Analysis
Adds to
Understanding including parameter value table, ScanHisto
ScanOverlay modes for different display
views adding
more insight.
LabNotebook: Enables users
to focus on
results rather than the process, as they can now save all displayed
waveforms,
save the relevant DSO setups with the saved waveform, add freehand
notes right
on the screen with a stylus or as text, convert the complete report to pdf, rtf, or html, and print or email
reports
Cable De-Embedding: Even expensive, high-performance cabling can
have an
adverse effect on measurements and decrease margin from a design. Cable
losses
and slow rise times can lead to intersymbol
interference (ISI). The cable de-embedding feature removes these
adverse
effects providing more accurate measurements.
High-Speed Automated Compliance Packages: LeCroy's
compliance tests feature fast, automated test operations, illustrated
instructions, connection diagrams, and stop on fail feature. Complete
test
reporting is also provided.
LeCroy will be joined by Rohde &
Schwarz!
Presentation: Phase Noise Measurements to 110 GHz
Demo Stations:
Vector
Network Analysis to
325 GHz
Signal Generation to 325 GHz
Spectrum Monitoring
LeCroy
Contact:
Guy Langston
Phone: 303-888-8034
Email: Guy.langston@lecroy.com
Presented by Paul Sweat of National Instruments
Date: Tuesday, November 4th, 2008
Location: Building 1, Room 1-4020
Time: 9:00 AM to 10:30 AM
Session Description:
National Instruments has been pouring R/D resources into the
development
of some exciting Real-Time and FPGA technologies.
Please join us to learn how you can leverage
these developments to add determinism and reliability to a variety of
measurement and control applications.
Learn which programming practices are best for optimizing the
performance of hard real-time applications, and gain a detailed
technical
understanding of real-time concepts such as preemptive scheduling,
priority
inversion, jitter, multicore programming,
and
more. Also, learn how to harness the
power of FPGAs in your design using the latest technologies in LabVIEW
FPGA. If you have not dealt with Real
Time Systems before I encourage you to read over the following
information
prior to attending the session
Pre-Session
Readings:
Multicore Programming Fundamentals:
http://zone.ni.com/devzone/cda/tut/p/id/6422
Wikipedia Article on Real-Time
http://en.wikipedia.org/wiki/Real-time
Wikipedia Article on FPGAs
http://en.wikipedia.org/wiki/Fpga
Web-Event: Introduction to Real-Time Technologies
Product
Information: Real
Time Measurement and Control
User Solution:
Boeing Measures Reduced
Aircraft Noise Emissions with NI PXI
and LabVIEW
http://sine.ni.com/csol/cds/item/vw/p/id/684/nid/124200
About the Presenter: Paul Sweat is a Business Development Manager for the National Instruments LabVIEW Embedded platform. Paul works closely with lead users of NI's LabVIEW Real-Time and FPGA embedded systems throughout the Rocky Mountains and Pacific Northwest. Paul has been with NI for 9 years. Prior to this role, he worked as a Field Applications Engineer and District Sales Manager in Colorado. Paul graduated from Kansas State University with a BS in Computer Engineering.
Presented by Chris Fonda of National Instruments
Date: Tuesday, September 23rd , 2008
Location: Building 1, Room 1-4020
Time: 9:00 AM to 10:30 AM
Session
Description: Learn how you can create flexible sound and
vibration
solutions for applications such as audio testing, acoustical
measurements,
environmental noise testing, vibration analysis, NVH measurements,
machine
condition monitoring, rotating machinery evaluation, and much more.
Explore
the technologies and techniques behind a sound and vibration
measurement and
analysis system including:
Microphone
and accelerometer sensor operating theory
Modular
sound and vibration instrumentation
Signal
processing for vibration, acoustic, and other signals
Pre-Session
Product
Information: Sound and Vibration Measurement and Analysis:
http://www.ni.com/soundandvibration/
User Solution:
Boeing Measures Reduced
Aircraft Noise Emissions with NI PXI
and LabVIEW
http://sine.ni.com/csol/cds/item/vw/p/id/684/nid/124200
Implementing
RF and Wireless Communications Applications
with LabVIEW
Presented by
David
Hall
Tuesday, August
12, 2008th , 2008
Session
Description: A wide range of systems and
applications incorporate RF, microwave, and wireless devices and
signals.
Advance your fundamental knowledge and obtain essential information
about
analog and digital modulation, I/Q data, RF and microwave
specifications, and
spectral measurements using LabVIEW software and PXI modular
instrumentation.
Pre-Session
http://digital.ni.com/express.nsf/bycode/exdnsr
Baseband
Developers Kit: Download a free interactive LabVIEW-based executable to
learn
more about basic modulation concepts
http://digital.ni.com/express.nsf/bycode/baseband
Product Information: National Instruments RF Product Line
About the Presenter: David
Hall is the product
manager for RF and Communications at National Instruments. His areas of
expertise include digital signal processing, digital communications
systems,
and RF measurements. David graduated from Penn State University with a
BS with
honors in computer engineering.
Using
National Instruments Hardware with C, Microsoft
Visual Basic, and Microsoft .NET Programming Languages
Presented by Wendy Logan
Tuesday, July 8th , 2008
Session Description: National Instruments provides world class C, Visual Basic and .NET tools. Come learn how you can leverage the world class hardware drivers developed by National Instruments to develop sophisticated control and test applications using C, Visual Basic or .NET. We will also show briefly how you can improve your productivity by leveraging LabWindows CVI, our proven ANSI C integrated development environment, and how you can develop impressive user interfaces by leveraging Measurement Studio, our integrated suite of classes and controls, for use with Microsoft Visual Studio 2005, Visual Studio .NET 2003, and Visual Studio 6.0
Product Information: LabWindows CVI:
http://www.ni.com/lwcvi/
Measurement Studio:
http://www.ni.com/mstudio/
About the Presenter: Wendy Logan is the product
marketing engineer for LabWindows/CVI and
Measurement
Studio at National Instruments. Her current projects include outbound
marketing
and product strategy for Measurement Studio and LabWindows/CVI.
Wendy started with National Instruments in 2004 after receiving a
bachelor of
science in computer science from Rice University.
Strategies for Data Storage and
Retrieval
Presented
by Otmar Foehner
Tuesday,
May 20th, 2008
Session Description:
If you are collecting measurement
data, saving it for reuse, and
sharing it with others, you know the challenges involved. Explore
different
data storage technologies and understand how they apply to a variety of
applications. Learn effective tips and explore hidden features for
documenting
and mining test data.
Pre-Session
http://zone.ni.com/wv/app/doc/p/id/wv-133
Increasing Your Test Department Productivity through Proper Data Management
http://zone.ni.com/devzone/cda/tut/p/id/2814
Product Information: National Instruments DIAdem Data Management Software
About
the Presenter: Otmar D. Foehner
is the Business Development Manager for Data Management and DIAdem
at National Instruments. His areas of expertise include data management
and
data mining as well as data post-processing. Otmar
has 20 years of industry experience and started his career at NI in
1988 in a
customer education management position.
Using
National Instruments Hardware and Software for Rapid Control
Prototyping and
Hardware-in-the-Loop Simulations
Presented by
Javier Guiterrez
Tuesday, April 8th
, 2008
Session
Description: Hardware-in-the-Loop (HIL) simulation allows
engineers to test
control algorithms earlier in the development process and with greater
coverage
compared to physical testing alone. HIL testing is an increasingly
popular
methodology used in reducing the design and validation time of complex
systems. Please join us to see how
engineers use
LabVIEW and other Industry Tools to effectively implement HIL solutions. If you do not know much about HIL, please
read the link below from Embedded.com.
They have developed a great example using HIL to prototype an
airplane
autopilot system which makes HIL simulation more clear.
Pre-Session
http://www.embedded.com/story/OEG20011129S0054
http://www.ni.com/labview/test/hil_test.htm
About the
Presenter: As Product Manager for the National
Instruments
LabVIEW Simulation and Control Design Tools, Javier Guiterrez
is responsible for managing contact with primary users of NI industrial
control
applications. Gutierrez joined NI Spain in 2000 as an application
engineer,
where he also held positions as a field sales engineer, district sales
manager
and applications engineer manager. He transferred to NI Corporate in
The Universal LabVIEW Architecture
Presented by Nancy Hollenback
Tuesday, February 26th, 2008
Session Description: Learn how to
create flexible scalable LabVIEW
programs that will be easy to maintain and upgrade for years to come. National Analytics, a National
Instruments
alliance member in
Pre-Session
http://zone.ni.com/devzone/cda/tut/p/id/3024
Application Design Patterns: Master/Slave
http://zone.ni.com/devzone/cda/tut/p/id/3022
Application Design Patterns: Producer/Consumer
http://zone.ni.com/devzone/cda/tut/p/id/3023
Product Information:
National Instruments LabVIEW
About the Presenter: Nancy
Hollenback,
used to be an employee of National Instruments.
She now works with National Analytics a National Instruments
Alliance
Member developing LabVIEW code for companies in the
National Analytics Website: http://www.nationalanalytics.com/
NI-Vision and the National Instruments
Smart Camera
Presented by Brent Runnels
Tuesday, January 22nd,
2008
Session Description:
National Instruments Smart Cameras are industrial, high-quality
image
sensors combined with powerful processors to create rugged, all-in-one
solutions for machine vision applications. You can use these cameras
for
applications including quality control, packaging verification, robot
guidance,
optical character recognition, and 2D code reading.
Please join us to learn more about this
powerful new technology.
Pre-Session
Product Information:
NI Smart Cameras:
http://sine.ni.com/nips/cds/view/p/lang/en/nid/204077
National Instrument Vision Offering:
About the Presenter:
Brent Runnels is a part of the
National Instruments System
Engineering group and he focuses on embedded systems and machine vision. Brent also served as the Lead Support
Engineer for all of National Instruments, image acquisition hardware
and software
for two years.
LabVIEW FPGA - Learn How to
Design Custom Circuits with Ease Using LabVIEW
Date: Tuesday, December 4,
2007
Presented by Will Denman of National Instrument
During this seminar we will develop a custom LabVIEW FPGA circuit using LabVIEW which will monitor the temperature in the room and illuminate a light or play a sound when the temperature exceeds a set-point. Unlike in normal LabVIEW programming, however, this code will be downloaded and compiled to run on a dedicated FPGA chip! We will begin our programming from scratch so that by the end of the meeting everyone will understand what it takes to write a LabVIEW FPGA application. For the demonstration I will be using our Compact RIO hardware.
The LabVIEW Project - A
Necessary Tool for LabVIEW Programmers
Date: Tuesday,
October 23, 2007
Presented by Will
Denman of National Instrument
Prior to LabVIEW 8,
managing all files related to LabVIEW applications
was difficult because users had to manually track the large numbers of
files
involved in a typical program. The introduction of the LabVIEW Project
in
LabVIEW 8.x has vastly simplified managing and organizing both LabVIEW
and
non-LabVIEW files used in an application.
The project has
made it much easier to build executables, share your
programs with colleagues, and seamlessly move program hierarchies from
machine
to machine. It is also used to deploy
Please join us to
learn more about this powerful tool.
What’s New in LabVIEW 8.5
Date: Tuesday,
September 11, 2007
Presenter: Will
Denman of National Instruments
What are the new
and changed features in LabVIEW 8.5
The LabVIEW
Project: When developing useful applications, users often
times run into more issues than just those related to developing the
code
itself. The front end of this presentation will briefly touch on a few
of these
challenge areas, and then talk about how the LabVIEW Project can help
users
alleviate these challenges.
Overview of the NI
Circuit Design Suite
Date: Tuesday, July 17, 2007
Presenter: Patrick Noonan (National Instruments)
NI Multisim and NI Ultiboard
are new products that have recently been folded into the NI family of
products. NI Multisim is an
easy to use
schematic entry tool and simulation tool bundled into one.
By
combining simulation and virtual instrumentation technology into one
package,
engineers and scientist can bring complex simulations and complex
measurements
into a single environment. If the intended purpose is to go to a
physical
board layout, NI Ultiboard allows the user
to build
complex PCB to realize their designs. With this in mind,
NI-EWB
tools can be the next step into integrated design, prototyping and
testing out
your engineering ideas (both electrical and non electrical as I will
demonstrate).
State Machines: Architecting LabVIEW
Date: Tuesday,
June 26, 2007
Presented by Will Denman of National Instruments
State machines have become the design structure of choice for developing mid to large scale programs because of their flexibility, expandability, and readability. But even small programs, especially those that might be modified or expanded in the future, can also benefit from state machine design concepts.This hands-on seminar will show you how to design and build state machines.
Custom Hardware Timing,
Triggering, and Synchronization with LabVIEW
Date: Tuesday, March 6, 2007
Presented by Ed McConnell of National Instruments
If you have ever used hardware to collect data, then you have
probably
wanted to trigger the instrument, count or time particular occurrences
as they
happen, or even synchronize the instrument with another device. As you
know,
there are several different ways to accomplish these tasks. During this
presentation, I will cover the basics of counters, triggering, and
synchronization techniques used by National Instruments hardware. You
will
learn when and how to use the counting, triggering, and
synchronization,
features of multifunction data acquisition devices, dedicated counter
cards,
reconfigurable (FPGA) devices, and modular instruments.
New and Enhanced
Features in LabVIEW 8.20 (Things you need to know
about LabVIEW 8 ... MathScript, TDM,
Shared
Variables, and more)
Date: Wednesday, November 1, 2006
Presented by Apryl Sweat of National Instruments
LabVIEW 8.20 introduced and
enhanced several features that will interest you. The MathScript
is an incredible feature that allows you to do textual math analysis
along with
graphical programming. The DLL Import Wizard is another feature
that
makes bringing external code into LabVIEW extremely easy. Join us
to
learn more about these features and several others.
MathScript
Object-oriented programming
DLL Import Wizard
FPGA Import Wizard
3D graph controls
Enhanced real-time compiler
Compilers for ADI Blackfin DSPs and 32-bit microprocessors
and many more!
Development Guidelines for
LabVIEW
(How to Create Effective User Interfaces and Efficient Block Diagrams)
Date: Wednesday, September 27, 2006
Presented by Apryl Sweat of National Instruments
Good practices are critical when developing quality software programs in any application development environment. With the graphical nature and dataflow model of LabVIEW, the style guidelines developed for typical ADEs like C or Java do not necessarily apply.
To promote good software development practices, National Instruments has developed LabVIEW-specific style guidelines. During this session, I will cover some of the LabVIEW Best Practices as well as how to use the LabVIEW Style Guidelines. I look forward to seeing you there!
Advances in Instrument Control
with LabVIEW 8.0
Date: Wednesday, August 2,
2006
Presented by Apryl
Sweat of National Instruments
Instrument Control is a fundamental aspect of every project. National Instruments is continuing its commitment to make instrument control as easy as possible for our users through advances in LabVIEW 8.0 and SignalExpress. LabVIEW 8.0 improved instrument control with technologies such as the Instrument Driver Finder and the Instrument Driver Wizard. If you have ever had a question about how to automate a test or get a measurement into your computer using your bench top instruments, then you will definitely want to attend this session.
Creating Professional User
Interfaces with LabVIEW
Date:
Presented by Apryl Sweat of National Instruments
The graphical user interface is one of LabVIEW's greatest strengths. Yet, many of our customers create cumbersome, difficult to read interfaces for their programs. During this presentation I will cover:
Proper style guidelines for creating graphical user interfaces
Customizing controls and employing the new XControls in LabVIEW 8
Creating custom run-time menus and toolbars
Using subpanels, splitter bars, and tab controls to maximize screen real-estate
Effective use of property nodes to dynamically control various aspects of your user interface
Tips & Tricks for creating professional interfaces in LabVIEW
Advanced NI-DAQmx
Programming Techniques with LabVIEW
Date:
Presented by Apryl Sweat of National Instruments
This presentation begins with an introduction of data acquisition and measurement fundamentals, covering the basics of programming in NI LabVIEW using high-performance NI-DAQmx driver software. It then goes beyond NI DAQ Assistant to address advanced data acquisition topics including complex timing, synchronization, working with buffers to optimize system performance, and internal signal routing – leaving you with new programming skills for quickly developing powerful data acquisition programs in LabVIEW.
Who should attend: Engineers, scientists, and technicians who collect data in LabVIEW; LabVIEW programmers new to NI-DAQmx programming: and experienced NI-DAQmx programmers.
Using Projects in
LabVIEW 8.0
Date:
Presented by Apryl
Sweat of National Instruments
One of LabVIEW 8.0's biggest features is the LabVIEW Project. The new LabVIEW Project streamlines your application and system management with tools that help you manage all the files in a large application, simplify the challenges of team software development, and organize all your hardware targets.
In this presentation, I will cover the capabilities of the LabVIEW Project in depth. From building executables and installers to targeting hardware, we will cover everything you need to know to effectively use LabVIEW Projects.
Self-Learning
and Self-Help in LabVIEW
Date:
Presented by Apryl
Sweat of National Instruments
Have you ever spent several hours (or days) troubleshooting a bug in your LabVIEW code? Do you know how to find the information you need to effectively write a working LabVIEW application?
This session will teach you the best ways to debug, troubleshoot, and get the information you need to successfully and efficiently create your applications. We will cover the debugging and help tools within the LabVIEW environment, as well as how to get external help from the National Instruments website, applications engineers and other helpful resources.
LabVIEW 8.0: New
Features and Functions
Date:
Presented by Apryl
Sweat of National Instruments
Webinar:
What's New in LabVIEW 8.0
It's here!!
LabVIEW 8.0 has been released and it's huge!!
There have been several enhancements to the latest version of
LabVIEW
including the addition of Projects, distributed intelligence, textual
math
tools, commenting code and much, much more. During this session
you will
learn about some of the new features and functionality of LabVIEW 8.0.
The new LabVIEW Project streamlines your application and system
management with tools that help you manage all the files in your large
application, simplify the challenges of team software development, and
organize
all your hardware targets. Distributed intelligence is a
collection
of technologies that simplify the development of processes running
across
applications and among remote devices. Come and get your first
glance at
the latest release of LabVIEW!
Refactoring
LabVIEW Programs: A Systematic Approach for Improving
Existing VI’s
Date:
Presented by Apryl Sweat of National Instruments
Do you need to add
features to, or debug a program whose source is
difficult to understand? If so, you may consider refactoring the
code. Refactoring is the process of improving the internal
structure of a
program without altering its external behavior. After
refactoring, it
becomes easier to add features or modify the behavior of the
program.
Refactoring is an accepted technique for improving programs written
using
traditional programming languages. You will see how you can refactor LabVIEW programs efficiently and in a
controlled
manner. We'll discuss what and when to refactor,
and the importance of testing for successful refactoring. We'll
go over
some specific refactorings that apply to
LabVIEW, such
as creation of subVIs and movement of
objects and
wires on the diagrams. While individual refactoring steps may
seem too
simple to be worth doing, the combined effect of multiple steps may
result in
final program design being substantially better than the original.
LabVIEW and DAQ
(With Simulated Instruments in DAQmx)
Date:
Presented by Apryl Sweat of National
Instruments
With the release of LabVIEW 7.x and NI-DAQ 7.4 it is now possible to simulate, in software, a wide variety of National Instruments DAQ hardware. And using DAQmx within Measurement and Automation Explorer (MAX), virtual channels can be defined for the simulated instruments. This allows a LabVIEW programmer to develop and test data acquisition code on any computer with or without DAQ hardware!
This hands-on seminar will show you how to configure your DAQ hardware (real or simulated) and how to develop portable LabVIEW code by taking advantage of this new NI-DAQ feature.
A Day of LeCroy
Technical Seminars: Maximizing the Power of Digital Oscilloscopes
Date:
Presented by Dr.
Mike Lauterbach and Guy Langston, from LeCroy Corporation
Presentation
materials for these LeCroy sessions are
available
from Jim Filla, x5592, Rm 1-4541
Morning Session:
9:00 am to
This seminar covers new technology and techniques
which have
been developed in the last few months for characterization, analysis
and
troubleshooting of serial data signals. Emphasis will be on SATA, SAS,
PCI
Express and other practical examples. Recent advances in probing
technology
make it possible to acquire low voltage high speed signals with less
loading
and greater signal integrity and new techniques for data acquisition
enable
engineers to capture serial data test patterns of up to 2^23 bits with
100
percent confidence that every bit in the pattern has been captured and
well
characterized. Emphasis will be on engineering tools for signal
integrity
testing, locating errors in serial data streams, characterizing the
robustness
of designs and tips for getting products to market faster. A wide
variety of
real life examples will be presented.
The seminar will cover advanced techniques for
capturing and
testing a wide variety of high speed serial data signals.
The majority of the material focuses on many
practical examples in real circuits, component characterization and
compliance
testing for popular serial data standards including SATA, SAS, PCI
Express and
others. There will be a discussion of
minimally invasive methods for probing low voltage differential
signals, the
use of long memory with oversampling and other measurement methods
which
increase the accuracy of signal integrity measurements.
The attendee will learn the most advanced
techniques for, Rj/Dj
separation, locating errors when doing eye pattern mask testing,
techniques to
directly measure intersymbol interference
and methods
for making bit error rate estimations.
Engineers who design high speed semiconductor
devices,
serial data components or circuits where eye pattern analysis or bit
error debugging
are critical will benefit from this seminar.
Focus is on methods to most accurately probe, capture and
measure real
time signals. Design or test engineers who need to characterize the
amount of
total jitter in a serial data stream, characterize jitter components,
learn new
techniques to verify if serial data components/circuits meet industry
standards
and who desire practical advice for troubleshooting the sources of bit
errors
are encouraged to attend.
Afternoon
Session:
This seminar focuses on the methods to most
accurately
capture and analyze short, fast electronic pulses.
Topics include optimal use of ADC resolution,
how many samples are sufficient for accurate reconstruction of pulse
shape, how
the spectral “flatness” of an oscilloscope Bode plot affects the shape
of short
term time domain events, tracking key parameter values for a series of
pulses
and techniques for analyzing information in the time and statistical
domains. There will also be a discussion
of techniques for optimizing the capture or closely spaced, or
intermittent
events with a view toward ensuring maximum likelihood that all events
are
captured. A variety of methods to
display and compare pulse shapes will also be presented.
Objectives
The primary aim of this seminar is to make
the
attendee aware of the latest technology and techniques for capturing
short,
fast electronic pulses. It also provides
insights into the best matching of available bandwidth, sampling and
display
technology available in modern digital oscilloscopes (or digitizers)
with the
needs for accurate capture of this type of signal.
The user will also see application of both
real time and post acquisition processing to gain insight into the key
characteristics of captured events.
Engineers or scientists who work with lasers, EMP
or other
types of short fast signals are encouraged to attend.
The material provides both theoretical
background and practical examples of techniques for accurate capture
and
analysis of such data.
Presenters: Apryl
Lynes of National Instruments
And Kevin Wells and Adam O'Connor of RSI
Have
you ever wanted
a geospatial or 3D view of your data inside of LabVIEW? Have you
ever
wished you could use IDL with real-time data? Well you’re in luck
because
National Instruments and Research Systems, Inc. have partnered together
to
increase your data visualization capabilities. During this
session
representatives from RSI will demonstrate their new IDL Script Node for
LabVIEW, which allows users to execute IDL scripts and programs
directly within
the LabVIEW environment.
Presenter: Apryl
Lynes of National Instruments
Have
you ever wondered how to write more efficient, higher performance
LabVIEW
programs? Do you currently use several
sequence structures in your code? Using
proper programming architecture in LabVIEW allows you to create much
more
efficient, faster running, and easier to debug code.
In this session you will:
Learn about different types of program architectures in LabVIEW
Learn how to easily incorporate state machines in your LabVIEW code to increase speed, flexibility, and maintainability
Understand the differences between producer/consumer loops, simple state machines, state machines with a parallel event handler, and more
Learn how to incorporate simple functions like queues and enumerated types to make your code clean and easily readable
Title: Is LabVIEW Too
Much For You (or Isn’t there an easier way to make just one
measurement!?)
Date:
Presenters: Apryl Lynes and Ed McConnell of National Instruments
"I just want to
take a quick measurement, and don’t want to write
a full program in LabVIEW”. or “Wouldn’t it be nice to have a picture
of my
oscilloscope screen, but I forgot the digital camera and I don’t want
to write
a full program”. These statements are common in the measurement
world. While LabVIEW is getting much easier for people who just
want to
take a quick measurement, it can still be too much. During this
session,
I will introduce a new tool from National Instruments that will help
you take
those quick measurements. SignalExpress
is
interactive software designed to meet the needs of design and test
engineers
who need to quickly acquire and analyze electronic signals. SignalExpress simplifies your exploratory and
automated
measurement tasks by offering:
Title: LabVIEW
Seminar Series – Refactoring LabVIEW Programs: A Systematic Approach
for
Improving Existing VI’s
Date:
Presenter: Apryl Lynes of National Instruments
Presenter: Apryl
Lynes (National Instruments)
This is a Hands-On seminar
where you will learn about the
latest instrument control uses such as GPIB, RS-232, VXI, USB and
Ethernet and
how to control stand-alone instruments through these buses. You
also
learn about advanced instrument driver technologies including the VISA
I/O
software and IVI instrument drivers to develop interchangeable test
systems. Finally, you learn to increase your test system
performance
using the latest advancements in modular instrumentation bus, PXI.
The main topics covered in this seminar will be:
The GPIB bus and other stand-alone instrumentation buses such as Ethernet and USB
Instrument control software such as VISA and IVI to create bus-independent, reusable systems
Increasing
your system performance
using PXI, an
open PC-based bus technology
LabVIEW Hands-On Seminar – Part 2: Step by
Step Data Acquisition
Presenter: Apryl Lynes
(National Instruments)
Test
drive professional PC-based
data acquisition systems at this hands-on seminar. I will show
you how to
create modular and flexible systems with short development times at low
costs. NI data acquisition and signal conditioning products
ensure highly
accurate measurements, and NI LabVIEW gives you the power to easily
analyze and
display your acquired data.
The main topics covered in this seminar will be:
Title: DAQ and
Instrument Control With VB, C++, and .net
Date:
Presenters: Apryl Lynes of National Instruments
This
seminar will introduce you to a Visual Studio add on
module that will assist you in data acquisition and instrument control. Measurement Studio is an
integrated suite of
native classes and controls for measurement and automation applications
in
Visual Studio .NET. Measurement
Studio dramatically reduces application development time with wizards,
simplified data networking, and .NET user interface controls. New code designers
interactively define
reusable acquisition tasks and automatically generate code. Advanced analysis libraries
and rich
object-oriented hardware APIs, such as data acquisition and instrument
control,
enable the development of sophisticated measurement applications.
***Prerequisite: Attendees will need a basic knowledge of
Visual Basic, C++ or .NET, as I will not be going over the fundamentals
of the
programming languages. I will only be
demonstrating
the Measurement Studio tool.
Title: LabVIEW
Hands-On Seminar – Advanced Math vi’s, MATLAB, Simulink
in
Date:
Presenters: Apryl Lynes of National Instruments
MATLAB toolkit: This
seminar introduces you to a new toolkit that provides you with a
seamless link
for using your LabVIEW code in the MATLAB environment.
Simulink Toolkit: The new LabVIEW Simulation Interface
Toolkit 2.0 adds patented LabVIEW technology to The MathWorks
Simulink® environment to view and control
data in the
environment.
Title: LabVIEW
Hands-On Seminar – Remote Connection, Monitoring, and Control with
LabVIEW
Date:
Presenter: Jim Filla of NIST
This seminar will show how to remotely monitor or
control
LabVIEW. For example, if you are running a
Title: LabVIEW
Hands-On Seminar – Introduction to LabVIEW 7.0
Date:
Presenter: Ed McConnell of National Instruments
This seminar gives you a first, hands-on, look at the new version of LabVIEW, introducing Express VI’s.
Title: LabVIEW and
Technical Data Management and Report Generation
Date:
Presenter: Ed McConnell of National Instruments
This seminar introduces you to the various tools available for LabVIEW for analyzing large amounts of technical data, for saving data into various file formats for post processing, and for report generation automatically. Come to this session to learn how to automate your data analysis and stop wasting time cutting and pasting into Word and Excel.
Title: Using the New
NI LabVIEW Lock-in Amplifier Start-Up Kit
Date:
Presenter: Ed McConnell of National Instruments
See how to extract
signals buried in noise with the new LabVIEW Lock-in Amplifier Start-Up
Kit.
National Instruments Lock-In Amplifier Start-Up Kit provides Virtual
Instrumentation for the precise measurement of AC signals that are
partially or
completely buried in noise. The kit extends the power of LabVIEW-based
signal
processing to measure signals that you could not measure before, such
as very
small signals buried 100 dB deep in noise. An example of this includes
extracting a 50 µV sine wave from a white noise signal with 5V
amplitude. Learn
how to measure a 10 nV AC signal buried in
400 mV of
noise. See how turning your DC signal into an AC counterpart can help
you fight
noise.
LabVIEW Programming Technique : VI Server and
the Use of
Advanced Timing and Synchronization Tools
Date:
Presenter: Ed McConnell of National Instruments
Agenda: Vi Server applications can be used to start and control vi’s from other vi’s in local or remote locations. This session will explore the uses of VI Server. Various functions in the Block diagrams Functions/Advanced palette will be described with example code. These will include Rendezvous, Occurance, Semaphore, and Notification.
LabVIEW Programming
Technique : State Machine Programming with Emphasis on the Event
Structure and
Queues
Date:
Presenter: Ed McConnell of National Instruments
Agenda: Have you ever wondered how to write more efficient, higher performance LabVIEW programs? Do you currently use many sequence structures in your code? If so, you need to learn about a much more efficient, faster running, and easier to debug method for programming in LabVIEW. This session will describe the State Machine and the various types : string, enum, and queued state machines.
LabVIEW Programming
Technique : Efficient Memory Management
Date:
Presenter: Ed McConnell of National Instruments
Agenda: This session will focus on programming methods for efficient memory use in LabVIEW. The use of locals and globals will be discussed, along with the best ways to create and manage large arrays of data. Memory analysis methods as well as an indepth description of how the LabVIEW compiler allocates memory will be demonstrated. You should attend this seminar if you are using locals, globals, arrays, or have wondered how memory is managed by LabVIEW.
LabVIEW 6.1 New
Features Overview : Special Emphasis on the Event Structure
Date:
Presenter: Ed McConnell of National Instruments