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Plenary Presentations:
Role of
Atomic-Force Microscopy in the Characterization of High-Performance and
Reliable Nanomaterials, Nancy Burnham, Worcester Polytechnic
Institute
NSF
Programs, with Emphasis on Nano Mechanics and Materials, Ken Chong,
National Science Foundation
Reliability Issues -
Significance of Mechanical Behavior in Small Volumes to Design of
Reliability Nanomaterials and Nanoscale Devices, William Gerberich,
University of Minnesota
Nanomechanical Measurement Facility in the Advanced Measurement
Laboratory, Stephen Hsu, NIST
Significance of Adhesion and Interfacial Fracture in Design of Reliable
Nanomaterials and Nanodevices, Neville Moody, Sandia National
Laboratories
Materials Requirements and Measurements in Nanoscale Manufacturing and
Assembly, John Randall, Zyvex
300 mm
XRD Metrology - Ensuring Thin Film Reliability in Microelectronics,
Ken Rodbell, IBM
Nanomechanics Research at NIST, Douglas Smith, NIST
Challenges, Barriers, and Priorities for Nanomaterials Metrology
(workshop summary #1), Bob Keller, NIST
Barriers: Standards, Fabrication Tools, Measurement Tools, Data,
Understanding, Modeling Tools (workshop summary #2), Dave Read, NIST |
