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PROGRAM
(revised
08 August, 2007)
The poster viewing area will be open on Monday evening, from 6:00 pm to 8:00 pm, and Tuesday morning at 7:15 am,
so people can hang their posters. We will provide push-pins.
Tuesday, August 14, 2007
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8:00 am
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Welcome
Robert Keller, Materials Reliability Division, NIST
Martin Dunn, Mechanical Engineering, University of Colorado
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8:05 am
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Workshop Sponsor Perspectives
Clark Cooper, Materials Design and Surface Engineering, NSF
David Read, Materials Reliability Division, NIST
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Nanoscale Materials Characterization for Manufacturing
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8:30 am
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George Thompson, Intel - Nanoscale Materials Characterization in Semiconductor Manufacturing
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9:15 am
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Break - Coffee & Poster Viewing
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9:35 am
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Greg Blackman, DuPont - Challenges in Nanomanufacturing
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Poster Session I
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10:30 am
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5-Minute Poster Introductions (9 presenters)
1.1 Mengzhi Pang, Intel -
Development of Mechanical Characterization Method for Flip-Chip C4
Solder Joints
1.2 Neville Moody,
Sandia-Livermore -
Patterning Interfaces for Reliability of Thin
Film Devices
1.3 Dirk Pfeiffer, IBM T.J. Watson
Research Center -
Materials Characterization Challenges for Next
Generation CMOS Devices
1.4 Tom Campbell, ADA Technologies
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Electronic Nanometrology of Bulk Carbon Nanotubes
1.5 Jeremy Thurn, Seagate -
Wear and Fracture of Amorphous Carbon Films
1.6 Jun-hee Hahn, KRISS -
Mechanical Properties of Column Spacer for TFT LCD
1.7 Donna Hurley, NIST -
Measurements and Mapping of Nanomechanical Properties with
Contact-Resonance AFM
1.8 Grady White, NIST -
Small
Scale Test Specimens
1.9 Susanne Arney, Bell Labs,
Lucent-Alcatel -
Nanotechnology and Photonics (tentative)
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11:15 am
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Poster Viewing
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12:00 pm
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Lunch
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Government Agency Nanomaterials Characterization
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1:00 pm
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Clare Allocca, NIST - The United States Measurement System Assessment as a Foundation for the
Characterization of Nanomaterials Measurement Needs
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1:45
pm
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Anne Dillon, NREL - Characterization of Nanomaterials to Optimize Renewable Energy Applications
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Poster Session II
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2:30
pm
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5-Minute Poster Introductions (8 presenters)
2.1 Rachel Goldman, University of Michigan -
Ion-Cut-Synthesis for Materials Integration
2.2 Terry Xu,
University of North Carolina, Charlotte -
Alkaline-Earth metal
Hexaboride One-Dimensional (1D) Nanostructures for Thermoelectric Energy
Conversion
2.3 David Bahr, Washington State University -
Mechanical Reliability in Novel MEMS Materials
for Microscale Power Generation
2.4 Nicholas Barbosa III, NIST -
Electrically Actuated Cyclic Testing for Measurement of Mechanical
Properties in Thin Films
2.5 Joseph Brown, University of Colorado
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Modular Microsystem for Nanofiber Multiproperty Characterization
2.6 Frank Fisher, Stevens Institute of
Technology - Nanomechanics and Polymer
Nanocomposites
2.7 Lawrence Robins, NIST -
Development of Tip-Enhanced Raman Instrumentation
for Stress/Strain and Composition Mapping of Semiconductor Device Structures
2.8 Ivar Reimanis, Colorado School of Mines -
Using Nanoindentation
to Interpret Phase Transformations
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3:10
pm
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Coffee & Poster Viewing |
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4:00 pm
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Breakout Session I: Identify Critical Research Issues
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5:00
pm
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Re-convene:
Breakout Summaries and Panel Discussion
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6:00 pm
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Adjourn for the day
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Wednesday, August 15, 2007
State of the Art Characterization: Mechanics, Imaging
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8:00 am
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William Gerberich, University of
Minnesota - Plasticity and Fracture of High Strength Nanostructures |
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8:45 am
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George Pharr, ORNL/University of Tennessee - Critical Issues in Measuring Small Scale Mechanical Properties
by Nanoindentation
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9:30 am
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Break - Coffee & Poster Viewing
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9:45 am
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David Larson, Imago Scientific Instruments - LEAP Analysis for Materials Characterization
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Poster Session III
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10:30 am
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5-Minute Poster Introductions (9 presenters)
3.1 Horacio Espinosa, Northwestern University -
In Situ
Electron Microscopy Testing of 1-D Nanostructures
3.2 Weiquiang Ding,
Clarkson University -
Mechanical Characterization of One-Dimensional
Nanostructures
3.3 Erik Herbert, University of Tennessee and
MTS Nano -
Nanoindentation and the Dynamic Characterization of Viscoelastic Solids
3.4 Xin Zhang, Boston University
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Mechanical Behaviors of PECVD Dielectric Films for MEMS/NEMS Applications
3.5 Xiaoxia Wu, University of North Carolina,
Charlotte -
Young's Modulus Measurement of 1D Nanostructures with Atomic Force Microscopy
3.6 Patrick Waters, University of South
Florida -
Environmental and Residual Stress
Effects on Thin Film Adhesion
3.7 Warren Oliver, University of Tennessee and
MTS Nano - In
situ Mechanical Testing in a Scanning Electron Microscope
3.8 Jun Lou, Rice University -
Localized
Characterization of Effects of Chemical Functionalization on SWNT-Matrix
Interfaces
3.9 Michael Chandross, Sandia-Albuquerque -
Simulations of Boundary Lubricants with Model
Probe Tips
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11:15 am
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Poster Viewing
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12:00 pm
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Lunch
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Modeling of Nanoscale Materials Structure and Behavior
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1:00 pm
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George Fitzgerald, Accelrys - Multiscale Modeling of Nanomaterials: Recent Developments and Future Prospects
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1:45 pm
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Ed Webb III, Sandia National Laboratories - Linking Atomistic Modeling to the "Real World" - Stress Evolution
During Thin Film Growth
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Poster Session IV
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2:30 pm |
5-Minute Poster Introductions (6 presenters)
4.1 Harley Johnson,
University of Illinois at Urbana-Champaign -
Modeling Surface Instabilities using an Atomistic
Unit-Process Approach
4.2 Bo Yang, Florida Institute of Technology -
Analysis of
Nanoindentation of Graphite to Extract Graphene Properties
4.3 Kannan Subramanian, University of North
Carolina, Charlotte -
Microstructure and Multiple-Scale Simulations
4.4 Warren Oliver, MTS Nano and University of
Tennessee -
Compliance of G200 with ISO 14577
4.5 Wilkistar Otieno, University of South
Florida -
Reliability, Failure Characterization, and Intensity Function Estimates of
Nanosystems
4.6 Cheryl Hartfield, Omniprobe -
Non-technical Hurdles
for Nano-characterization
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3:00
pm |
Coffee & Poster Viewing |
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4:00 pm
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Breakout Session II: Identify Critical Research Issues
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5:00 pm
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Re-convene:
Breakout Summaries and Panel Discussion
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6:00 pm
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Adjourn for the day
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7:00 pm
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Workshop Banquet - all attendees invited
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Thursday, August 16, 2007
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8:30 am
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Tours at University of Colorado's Integrated Teaching and Learning
Laboratory
http://itll.colorado.edu/ITLL/
(You will be leaving NIST webspace upon selecting this link.)
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Consensus-Building and Workshop Summary
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9:30 am
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Moderators: Workshop Organizers and Sponsors
1. Specific characterization needs identified at this workshop
2. Bigger picture needs
3. Action items/roadmapping
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11:30 am
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Adjourn Workshop
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