A technique for the measurement of diffuse x-ray scattering on individual reciprocal sapce planes using high energy x-ray photons is described.  The method is demonstrated using a disordered crystal of the compound T1SbOGe0₄ and compared to data taken with a sealed tub Cu anode source.  Measurements were made on a synchrotron undulator beam line at an energy of 45 keV using Weissenberg flat-cone geometry and a storage phosphor (image) plate to detect the scattered x-rays.  Advantages of the method include:  extension of the accessible diffraction space to both higher and lower wave vectors, the ability to use crystals of irregular shape without the need for complicated absorption corrections, less need to carefully prepare sample surfaces, and the ability to simply filter fluoresence.

To be submitted to the Journal of Applied Crystallography

• Contact: Dan Friend