EEEL Holds NIST Laser Measurement Short Course, Aug. 2006

EEEL Hosts ISO Meetings on Optics and Photonics Standards

EEEL Holds 20th NIST Laser Measurement Short Course

EEEL Researchers Receive FLC Award for Excellence in Technology Transfer (02/08)

EEEL Researcher Receives Allen V. Astin Award (02/08)

EEEL Researchers Develop New Measurement Technique for Carbon Nanotubes (01/08)

EEEL Researcher Develops New Model for Pulse Oximetry (01/08)

EEEL Researchers Deliver Optical Transfer Standard to National Institute of Metrology (06/07)

EEEL Researchers Complete International Comparison of Optical Power Meters (02/07)

EEEL Adds New Wavelengths to Extend Laser Power and Energy Measurement Services

EEEL Researchers Demonstrate Rapid, Inexpensive Identification of Bulk Carbon Nanotubes

EEEL Researchers Develop Excimer Laser Treatment Process for Carbon Nanotube Coatings

NIST Hosts Council for Optical Radiation Measurements 2005 Conference

EEEL Measures Diode Laser Efficiencies

EEEL Researchers Complete International Intercomparison of Optical Fiber Power Measurements

EEEL Develops New High-Accuracy Transfer Standards for Optical-Fiber Power Metrology

EEEL Researchers Develop Novel Transfer Standard for Optical Fiber Power Measurements

EEEL Researchers Complete Intercomparison of NIST UV Laser Calorimeters

EEEL Researchers Develop New Excimer Laser Special Test

EEEL Expands UV Optical Material Characterization Facility to Include Laser Damage

EEEL improves high-speed waveform calibrations 01/08

EEEL Pulse Waveform Measurement Services Transferred to Boulder 04/07

EEEL/ITL Offer Free Software for Oscilloscope Timebase Corrections

EEEL Demonstrates Traceable Waveform Measurement up to 200 GHz

EEEL Researchers Explain Optical Measurement Techniques to the Microwave Community

EEEL Researchers Report Special Test of High-speed Photoreceiver to 110 GHz

EEEL Researchers Characterize High-speed Photoreceiver to 110 GHz

EEEL and SID Propose New Measurement Standards for Flat Panel Displays (06/07)

EEEL's Kelley Receives
2006 SID Special Recognition Award

EEEL Offers First Display Metrology Short Course

Joint NIST/NIH/ATA USMS Workshop On Medical Imaging and Telemedicine Held At NIST

EEEL Scientist Presents Short Course on Display Metrology

EEEL Researchers Develop Low-Cost Methods for Characterizing Projection Display Systems

EEEL Helps Dupont with Measurement of OLEDs

New Digital Cinema Tool Developed for the Motion Picture Industry

EEEL demonstrates novel high-resolution, broadband laser spectroscopy (01/08)

EEEL researchers demonstrate compact fiber laser with GHz fundamental repetition rate (09/07)

EEEL Researchers Narrow Up Fiber Laser Frequency Comb

EEEL Researchers Develop and Verify Theory of Fiber Laser-Based Frequency Comb Control

EEEL Researchers Demonstrate Frequency-Resolved Coherent Laser Radar for Ranging and Vibration Imaging Using a Femtosecond Fiber Laser

EEEL Develops High Accuracy Wavelength Calibration SRM

EEEL Demonstrates Accordion-Like Frequency Comb Using a Fiber Laser With a Variable Repetition Rate

Fundamental Phase Noise Limitations on Supercontinua Generated in Microstructure Fiber Analyzed by EEEL Researchers

Fiber Laser-Based Frequency Comb for Frequency Metrology in the Infrared
Developed by EEEL, OFS and PL Collaboration

EEEL Demonstrates Hybrid Wavelength Calibration Reference

EEEL Produces Two New Wavelength Calibration Standards for the Wavelength Division Multiplexing L-Band

Wavelength-
Dependent Gain of Raman Fiber Optical Amplifiers

Novel System to Accurately Measure Optical Frequencies in the Near Infrared Developed by EEEL and PL Colaboration

EEEL collaboration produces noise model for polarization-sensitive Optical Coherence Tomography

EEEL Researchers Measure Scattering Dispersion Using Optical Coherence Tomography

EEEL Researchers Develop New Technique for High-Resolution Characterization of Optical Modulator Chirp

EEEL Demonstrates Fast and Accurate Index Profile Measurements for Fiber Bragg Gratings

EEEL Delivers High Accuracy Calibration Instrument for Navy Optical Fiber Sensors

EEEL Researchers Quantify Resolution and Accuracy of Relative Group Delay Measurements for Optical Fiber Telecommunications

Two New Calibration Standards for Optical Fiber Communications

EEEL Measurement is Adapted to Meet the Changing Needs of the Telecommunications Industry

EEEL Demonstrates Wide-Bandgap Semiconductor Nanowire Technology

EEEL Measures Optical Properties of III Nitrides

EEEL Provides Data on Index of Refraction of AlGaN

EEEL Demonstrates Semiconductor Photon-Number-Resolving Detector (04/07)

EEEL Measures Homogeneous
Linewidth of Quantum Dots

EEEL Demonstrates Photon Antibunching at High Temperature from Single Quantum Dot

EEEL Measures Dipole Moment of Semiconductor Quantum Dots

EEEL Demonstrates Single Photon Source

EEEL Develops Calibration Source for Power in the Millimeter-Wave/Terahertz Range (10/07)

EEEL, ITL, and PL Researchers Demonstrate Record Data Rates for Superconducting Single Photon Detectors in QKD System

EEEL Researchers Deliver World's Fastest Detector System for Quantum Cryptography

EEEL Researchers Create Quantum-based Josephson Waveforms Using Optically Generated Pulses

EEEL Scientists Demonstrate High Efficiency Single Photon Detector

EEEL and University of Colorado Researchers Demonstrate Nanowire Oscillators with Record Q 01/08

EEEL Demonstrates Wide-Bandgap Semiconductor Nanowire Technology

EEEL Measurements Extend Gas Purity Instrumentation Range

EEEL Models AlGaAs Oxide Formation for Vertical Cavity Lasers

EEEL Researchers Measure Low-level Water Impurities in Phosphine

EEEL Study Accelerates Understanding of Oxidation Mechanisms Important to Laser Manufacturers

NIST Scientists Share Nanoscience Results with Leading Chemists

EEEL's Optoelectronics Division Holds 13th Biennial Symposium on Optical Fiber Measurements in Boulder

EEEL Holds Annual Laser Measurement Short Course

EEEL Optoelectronics Division Implements ISO/IEC 17025 Quality System

Dr. Sarah Gilbert Named a Fellow of the Optical Society of America

EEEL's Schlager Honored by the ITA

Rochford Succeeds Day as Division Chief

IEEE's Optoelectronics Division Hosts 12th Biennial Symposium on Optical Fiber Measurements in Boulder

EEEL's Robert J. Phelan, Jr. Elected IEEE Fellow

Allen V. Astin Award
2001