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SEMICONDUCTOR COMPOSITION

Composition Standards for Compound Semiconductors:

Standard Reference material (SRM) 2841 is intended for use as a reference standard for analytical methods that measure the compostion of thin films, such as electron microprobe analysis (EMPA), photoluminescence (PL), auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS). A unit of SRM 2841 consists of a 3 micrometer thick epitaxial layer of Al<dx>Ga<d1-x>As, grown on GaAs, with Al mole fraction x, nominally 0.20, certified by NIST to within an expanded uncertainty of 0.002 or less. The semiconductor piece is approximately 1 centimeter square and is mounted to a stainless steel disk (for labeling and handling) by the use of adhesive carbon tape. To order, go to the SRM 2841 Materials Details page.

NIST also offers units of SRM 2842 with Al mole fraction near 0.30. To order, go to the SRM 2842 Materials Details page.

For additional information please contact:

Kris Bertness
NIST, Optoelectronics Division (815.04)
325 Broadway, Boulder, CO 80305

TEL: 303.497.5069
FAX: 303.497.3387
e-mail: bertness@boulder.nist.gov
Page updated: 12/27/2007
Welcome to the National Institute of Standard and Technology Optoelectronics Division.

Calibration Support: Standard Reference Materials (SRM's) and Measurement Services (for fiber, components, and composition)
NIST, National Institute of Standards and Technology EEEL, Optoelectronics Division, Boulder