July 2005

EEEL Scientist Presents Short Course on Display Metrology

Edward Kelley of EEEL presented an invited lecture and short course on display metrology to representatives of Kodak and the Rochester Institute of Technology. Kodak is heavily involved in research concerning materials for organic light-emitting diodes (OLED) and flexible displays. The four-hour short course included material on practical methods for characterizing displays that the approximately 40 participants could use in their own laboratories.

Kelley also delivered the Weissberger-Williams Lecture to over 50 attendees (an over-capacity crowd). According to Kodak representatives, both the lecture and short course were immense successes. The audiences included chemists, physicists, color scientists, and metrologists, in addition to researchers working on display related projects. The uniform theme running through the subsequent one-on-one discussions was the lack of information regarding reflection characterization methods and material specification sheets. Kodak researchers are also interested in low-cost commercially available measurement systems for characterizing their materials.

Kodak felt that through Kelley's presentations and discussions, they gained knowledge that would benefit their research and assist them in validating their own metrology efforts.

Contact:

Ed Kelley, (303) 497-7455