|
October, 2004 EEEL's Optoelectronics Division Holds 13th Biennial Symposium on Optical Fiber Measurements in Boulder |
|
Every other year since 1980, metrologists from around the world have met in Boulder for the Symposium on Optical Fiber Measurements (SOFM), which covers optoelectronic measurement issues associated with optical fibers, related components and optical communications systems. SOFM is held in cooperation with the Optical Society of America and the IEEE Lasers and Electro-Optics Society. This year's meeting took place September 28-30, 2004, and brought scientists from 15 countries to present measurement-related research in optoelectronics. The papers were of high quality and covered a diverse range of topics including optical coherence tomography, microwave photonics, quantum cryptography, photonic crystals, optical pulse characterization, optical fiber nonlinearities, polarization-mode dispersion, chromatic dispersion, optical time domain reflectometry, optical wavelength metrology, and more. The talks are summarized in 4 - 6 page papers included in the technical digest. Copies of the digest are available free of charge from the Optoelectronics Division office. The reference information is: P.A. Williams and G.W. Day, Eds. "Technical Digest: Symposium on Optical Fiber Measurements, 2004", NIST Special Publication 1024, (2004).
Contact:
|