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January, 2004 EEEL Researchers Explain Optical Measurement Techniques to Microwave Community |
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EEEL researchers, Tracy Clement and Paul Hale, gave tutorials on optical measurement techniques at the 2003 Short Course on Microwave Measurements and Instrumentation, sponsored by the IEEE’s Automatic RF Techniques Group (ARFTG). These tutorials introduced basic concepts of microwave network analysis, high-speed sampling oscilloscopes, and the operation of basic optoelectronic components for wireless applications. In the first tutorial, participants learned how to make calibrated optoelectronic measurements using an ordinary microwave network analyzer and a calibrated photodiode. In the second tutorial, participants were informed of common errors in high-speed oscilloscope measurements and instructed in methods to perform better oscilloscope measurements.
High-bandwidth
measurements are needed for both wireless and optical communication systems.
Systems presently being installed operate at up to 40 gigabits per second.
Methods are needed to accurately characterize the scalar and vector frequency
response of high-speed sources, detectors, and instrumentation to three
to five times the system bandwidth. Material in the ARFTG tutorials grew
out of this work on advanced metrology, standards, and measurement services
for high bandwidth applications within the High-speed Measurements Project.
Customers for this work include manufacturers of optoelectronic and microwave
test equipment.
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