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November, 2002 EEEL’s Optoelectronics Division Hosts 12th Biennial Symposium on Optical Fiber Measurements in Boulder |
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Every other year since 1980, optical fiber metrologists from around the world have met in Boulder for the Symposium on Optical Fiber Measurements (SOFM), which covers measurement issues associated with optical fibers, related components and optical communications systems. This year’s meeting, held September 24-26, 2002, came at a time when many companies in the optical telecommunications industry are struggling to survive. Even so, 145 scientists from 18 countries attended and the number of paper submissions was up by about 50 % from the previous SOFM.
The high quality of papers and diverse topics made the conference especially useful. Popular topics included polarization-mode dispersion, nonlinear behavior, fiber and waveguide geometry, group delay, dispersion, wavelength calibration, polarization dependence, multimode fiber properties, and systems modeling. The talks are summarized in 4 to 6 page papers included in the technical digest. Copies of the digest are available free of charge from the Optoelectronics Division office. The reference information is: P.A. Williams and G.W. Day, Eds. “Technical Digest: Symposium on Optical Fiber Measurements, 2002”, NIST Special Publication 988, (2002).
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