March 2006

EEEL's Kelley Receives 2006 SID Special Recognition Award

Edward Kelley, a physicist in the Optoelectronics Division in Boulder, received the 2006 Society for Information Display (SID) Special Recognition award "for his many contributions to the theory, methods and technology of display metrology, including the development of a standard for flat-panel display measurements." Special recognition awards are given "to individuals of the technical and scientific community, not necessarily SID members, for distinguished and valued contributions to the information display field." Dr. Kelley is an internationally recognized expert in the field of display metrology as well as the principal author of the Video Electronics Standards Association's Flat Panel Display Metrology Standard. Dr. Kelley has given numerous invited talks and seminars at SID conferences, such as the SID International Symposium and the Americas Display Engineering and Applications Conference, and is the associate editor for Display Metrology for the SID Journal.


Visit the Display Metrology Short Course web page or contact Paul Boynton at (301) 975-3014 for more information about upcoming display courses.