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August, 2006 EEEL Hosts ISO Meetings on Optics and Photonics Standards |
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EEEL hosted two subcommittee meetings of the International Organization for Standardization Committee on Optics and Photonics (ISO/TC172). This meeting of the two ISO/TC172 subcommittees, Fundamentals Standards (SC1) and Electro-optical Systems (SC9), represented the largest international optical standards meeting held in the United States in over a decade. Ten working groups convened to discuss topics such as standards for general optical test methods, optical drawings, environmental test methods, laser systems for medical applications, and laser safety. A joint meeting was held between the two subcommittees to discuss the TC172 Online Properties Dictionary. This project, which is a substantial undertaking, will be split into two parts. One part will outline the general aspects and the structure of the dictionary; the second part will include a database standard. A total of 43 resolutions were adopted during the week-long meeting, which was attended by over 50 participants from six countries. Subcommittee 1 of ISO/TC172 met on June 26-29, 2006, to discuss standards related to mean transfer functions of sampled imaging systems, measurement procedures for interferometric measurements, photographic lenses, and optical drawings. Subcommittee 9 of ISO/TC172 met on June 28-30, 2006, to discuss standards related to diode lasers, electro-optical systems other than lasers, laser systems for medical applications, and laser safety. At the conclusion
of the meetings, tours of the NIST-Boulder Laboratory and Optoelectronics
Division were offered. The countries represented at the meetings were
France, Germany, Japan, Switzerland, United Kingdom, and the United States.
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