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February, 2004 EEEL
Helps Dupont with Measurement of OLEDs
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| Researchers
in the EEEL Display Metrology Project collaborated with Dupont Displays
(Santa Barbara, CA) in an investigation of the scalability of reflection
measurements in OLEDs (organic light-emitting diode displays or materials)
with attention to fluorescence. Difficulties in the characterization of
OLED performance for sunlight readability arise because of the expense and
difficulty of providing the proper sunlight-level illumination and the correct
solar spectrum. A less expensive alternative is to use lower-light-level
illumination under stable laboratory conditions to measure a display's readability
and then scale the results to sunlight levels. However, regarding OLEDs,
there is a concern that the fluorescence typically encountered with many
such displays may exhibit saturation at sunlight levels. If florescence
saturation were to occur it would prevent using scalable reflection measurements
and require full sunlight illuminance and spectrum to perform an accurate
characterization. It was demonstrated that that the OLED fluorescence was,
indeed, linear and scalable even up to illuminance levels of equal to the
magnitude of several suns. It is therefore possible to make laboratory reflection
measurements with much lower illuminance levels and scale them to appropriate
sunlight levels to qualify such displays for sunlight readability. Results
are to be reported at the Society for Information Display Symposium in Seattle,
WA in May 2005.
Contact:
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