Oscilloscope Measurements and Calibrations
Uncertainty of timebase corrections C. M. Wang, P. D. Hale, and D. F. Williams, IEEE Trans. Instrum. Meas., (in press).	399 kB - GET IT HERE
Calculation of pulse parameters and propagation of uncertainty P. D. Hale and C.M. Wang, IEEE Trans. Instrum. Meas., vol. 58, no. 3, pp. 639-648 (2009).	209 kB - GET IT HERE
Complete waveform characterization at NIST P. D. Hale, D. F. Williams, A. Dienstfrey, C. M. Wang, A. Lewandowski, T. S. Clement, and D. A. Keenan, Conference on Precision Electromagnetic Measurements, June 8-13, 2008, pp. 680-681.	80 kB - GET IT HERE
Characterization of a 50 GHz comb generator H. C. Reader, D. F. Williams, P. D. Hale, and T. S. Clement, IEEE Trans. Microwave Theory Tech., vol. 56, no. 2, pp. 515-521, (2008).	457 kB - GET IT HERE
Systematic error of the nose-to-nose sampling oscilloscope calibration D. F. Williams, T. S. Clement, K. A. Remley, P. D. Hale, and F. Verbeyst, IEEE Trans. Microwave Theory Tech., vol. 55, no. 9, pp. 1951-1957, (2007).	806 kB - GET IT HERE
The sampling oscilloscope as a microwave instrument D. Williams, P. Hale, K. A. Remley, IEEE Microwave Magazine, vol. 8, no. 4, pp. 59-68, (2007).	1.51 MB - GET IT HERE
Terminology for High-Speed Sampling-Oscilloscope Calibration D.F. Williams, T.S. Clement, P.D. Hale, and A. Dienstfrey, 68th ARFTG Microwave Measurements Conference Digest, Boulder, CO, Nov. 30-Dec. 1, 2006.	806 kB - GET IT HERE
Adaptive characterization of jitter noize in sampled high-speed signals K. J. Coakley, C. Wang, P. D. Hale, and T. S. Clement, IEEE Trans. Instrum. Meas., vol. 52, no. 5, 1537-1547 (2003).	509 kB - GET IT HERE
Uncertainty of oscilloscope timebase distortion estimate C. M. Wang, K. J. Coakley, T. S. Clement, P. D. Hale, IEEE Trans. Instrum. Meas., vol. 51, no. 1, 53-58 (2002).	259 kB - GET IT HERE
Alignment of Noisy Signals K.J. Coakley and P.D. Hale, IEEE Trans. Instrum. Meas., vol. 50, no. 1, 141-149 (2001).	196 kB - GET IT HERE
Least-squares estimation of time-base distortion of sampling oscilloscopes C. M. Wang, P. D. Hale, and K. J. Coakley, IEEE Trans. Instrum. Meas., vol. 48, no. 6, 1324-1332 (1999).	224 kB - GET IT HERE
Measuring the Response of Photodetectors and Modulators, Electro-optic Sampling
Covariance-based uncertainty analysis of the NIST electro-optic sampling system D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. A. Keenan, and A. Dienstfrey, IEEE Trans. Microwave Theory Tech., Vol. 54, pp. 481-491 (2006).	536 kB - GET IT HERE
Calibrated 200 GHz waveform measurement D. F. Williams, P. D. Hale, and T. S. Clement, IEEE Trans. Microwave Theory Tech., Vol. 53, pp1384- 1389 (2005).	507 kB - GET IT HERE
Uncertainty of the NIST electro-optic sampling system D. Williams, P. Hale, T. Clement, and C.-M. Wang, Natl. Inst. Stand. Technol. Tech. Note 1535 (2004).	3.08 MB - GET IT HERE
Calibrated measurement of optoelectronic frequency response P.D. Hale and D.F. Williams, IEEE Trans. Microwave Theory Tech. vol. 51, pp. 1422-1429, Apr. 2003.	4.04 MB - GET IT HERE
Measurement of chip photodiode response for gigabit applications P. D. Hale, T. S. Clement, D. F. Williams, E. Balta, and N. D. Taneja, J. Lightwave Technol. , vol 19, pp. 1333-1339, Sept. 2001.	92 kB - GET IT HERE
Calibrating electro-optic sampling systems D. F. Williams, P. D. Hale, T. S. Clement, and J. M. Morgan, IMS Conference Digest, 1473, May 2001.	124 kB - GET IT HERE
Optical Waveform Measurements and Impairment Monitoring
Optical performance monitoring using artificial neural networks trained with eye-diagram parameters J. A. Jargon, X. Wu, and A. E. Willner, IEEE Photon. Technol. Lett., vol. 21, no. 1, pp. 54-56 (2009).	176 kB - GET IT HERE
A robust algorithm for eye-diagram analysis J. Jargon, C. M. Wang, and P. D. Hale, IEEE J. Lightwave Technol. vol 26, no. 21, pp3592-3600 (2008).	1.38 MB - GET IT HERE
Synchronization monitoring of I/Q data and pulse carving misalignment for a parallel-type RZ-DQPSK transmitter by measuring RF clock tone/low frequency power X. Wu, L. Christen, B. Zhang, W.-R. Peng, J. Y. Yang, L. Zhang, S. R. Nuccio, L. Paraschis, J. Jargon, and A. Willner, IEEE Photon. Technol. Lett., vol. 20, no. 24, pp. 2138-2140 (2008).	485 kB - GET IT HERE
Vector signal characterization of high-speed optical components by use of linear optical sampling with milliradian resolution P. A. Williams, T. Dennis, I. Coddington, W. C. Swann, and N. R. Newbury, IEEE Photon. Technol. Lett., vol. 20, no. 23, pp. 2007-2009 (2008).	254 kB - GET IT HERE
Training of Neural Networks to Perform Optical Performance Monitoring of a Combination of Accumulated Signal Nonlinearity, CD, PMD, and OSNR X. Wu, J. A. Jargon, L. Christen, and A. E. Willner, The 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, CD-ROM WP4, pp. 543-544, Newport Beach, CA, (2008).	358 kB - GET IT HERE
Monitoring I/Q Data and Pulse Carving Misalignments in RZ-DQPSK Transmitters Using a Neural Network Approach X. Wu, J. A. Jargon, L. Christen, A. E. Willner, and L. Paraschis, The 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, WP2, pp. 539-540, Newport Beach, CA (2008).	358 kB - GET IT HERE
Off-Line Monitoring of OSNR/CD/PMD Degradation Effects Using Neural-Network-Based Training Sequences 10. X. Wu, J. A. Jargon, and A. E. Willner, European Conference on Optical Communications, CD-ROM We.3.D.6, Brussels, BELGIUM (2008).	120 kB - GET IT HERE
Page updated: 9/24/2009