We are working to develop and refine measurement procedures in support of ongoing electronic display metrology, and applying the results in the development of national and international standards for flat panel display characterization.

Plans for 2003:
To provide the Video Electronics Standards Association with a complete set of patterns for display measurements and set up for all pixel-array formats currently in use (approximately 40 000 patterns).

To assist in the grand revision of the ISO visual display ergonomic standards.

Plans for 2004:
To update the NIST setup patterns with more detailed patterns that will fully test displays' abilities to accurately render details (work done in collaboration with Sun Microsystems).

The characterization of the three components of reflection (Lambertian, specular, and haze) associated with displays is being developed. Development and implementation of robust metrics is needed to characterize display reflection performance under actual conditions, e.g., the readability of automotive displays in high ambient light conditions.

Plans for 2003:
To publish a summary report detailing robust reflection measurement methods appropriate to the display industry and prepare a short course for the Society of Information Display International Symposium that emphasizes reflection measurements. We will also prepare an in-house course on display metrology that provides hands-on laboratory measurements.

Plans for 2004:
To teach the in-house course on display metrology at least once each year up to four times per year and prepare reflection samples to simulate common flat panel display surfaces and conduct interlaboratory comparisons with industry (collaborative effort with NIST's Optical Technology Division).

Plans for 2005:
To analyze and publish how successful our variable-radius-source method is in capturing the specular component and haze peak in making robust reflection measurements. (This will also be a collaborative effort with NIST's Optical Technology Division).

To determine the measurement capabilities of participating laboratories in an interlaboratory comparison effort, this project has developed a multi-filter source-display measurement assessment transfer standard (DMATS) - that can be passed among participating laboratories. The combination of all the targets will stress the capabilities of most laboratories in making conventional luminance and color measurement. Typical light-source calibrations involve only a white point. These new standards include the white point and much of the color gamut. A simplified version of this apparatus employing filter wheels instead of a filter array has been developed - the gamut assessment standard (GAS). The DMATS/GAS solution is essential to resolving issues of color transportability in E commerce by assuring that the color measurement instrumentation employed is sufficiently reliable to discriminate color differences. This program is conducted in collaboration with the Physics Laboratory's Optical Technology Division.

Plans for 2003:
To investigate the design of a robust light source for using in the gamut assessment standard (GAS) and conduct at least one interlaboratory comparison with another national metrology institute.

Plans for 2004:
To refine the GAS apparatus and make multiple units to conduct general interlaboratory comparisons on a regular basis with industry.

Plans for 2005:
To have in place a general program to conduct interlaboratory comparisons based upon DMATS and GAS apparatus for any interested industrial laboratories.

In order to reduce stray-light contributions to the reference image and enable more accurate luminance measurements of complicated scenes involving high contrasts, a liquid-filled camera is under development that simulates the optics of the human eye.

Plans for 2003:
To investigate a third-generation eyeball-like camera and report progress at an industry conference.

Plans for 2004:
To investigate the use of the eyeball-like camera in accurately measuring near-eye displays and report results at an industry conference.