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GENERAL MEASUREMENTS FOR LASER METERS |
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The Optoelectronics Division conducts research on a variety of problems in the characterization of optoelectronics components. Consequently, we are interested in discussing and supporting all measurements involving laser detectors, sources, components, and instrumentation. Examples of measurement areas include beam profile, optical density or attenuation, and detector linearity. We also support instrumentation used with optical fiber power systems offering various optical fiber power related measurements upon request and by prearrangement. These include optical attenuator characterization, high power measurements, and power meter measurements involving unusual connector or fiber types. Please contact Marla Dowell for additional information. |
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Description
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Wavelength
|
Parameter
|
Documentation
|
Contact
|
| Detector Linearity | 10.6 µm | Xiaoyu Li | ||
|
248
nm
|
|
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193
nm
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Optical
Fiber Power Meter Linearity
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850,
980, 1300, 1480, and 1550 nm
|
-90
to 0 dBm
|
Igor Vayshenker | |
|
980
and 1480 nm
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0
to 30 dBm
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Laser
Dose
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193
nm
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Optical
Detector Spatial Uniformity
|
635,
850, 1300, 1550 nm
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| Spectral Responsivity of Laser and Optical Fiber Power Meters | 400 - 1700 nm | 10 - 100 µW | SP250-53 | John Lehman |
