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Division Overview
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Sources, Detectors and Displays Group
Optical Fiber and Components Group
Optoelectronics Manufacturing Group
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Optoelectronics Division (815.00) National Institute of
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Page updated: 09/24/2008 |
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September 2008 |
EEEL Researchers Develop Robust Algorithm for Eye-Diagram Analysis
EEEL researchers Jeffrey Jargon and Paul Hale, along with Chih-Ming Wang from the NIST Statistical Engineering Division, have developed a new method for analyzing eye diagrams. Eye-diagrams are multivalued displays used for assessing the quality of high-speed digital signals.
Click here for more information about the eye-diagram analysis.
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EEEL Researchers Uncover Missing Light
EEEL Researchers John Lehman, Katherine Hurst, and Lara Roberson, along with collaborators Kathryn Nield and John Hamlin of New Zealand’s Measurement Standards Laboratory, have identified unique features in the reflectance spectra of single-wall carbon nanotubes (SWCNT) that were previously misidentified in the literature as absorbance. In the process, they have demonstrated a novel method for determining SNCWT absorbance that, unlike other published accounts, is independent of sample concentration and does not rely on data post-processing to remove the effects of contaminants.
Click here for more information about the reflectance specta of sing'e-wall carbon nanotubes (SWCNT.)
EEEL develops all-fiber photon pair source with record low noise and high brightness
Researchers in the Optoelectronics Division of EEEL have demonstrated an all-fiber photon-pair source with the highest coincidence-to-accidental ratio (CAR) reported to date in the fiber-optic telecommunications C-band (wavelengths near 1550 nm). Shellee Dyer, Sae Woo Nam, Burm Baek, and Marty Stevens achieved this through careful optimization of pair-production efficiency as well as detailed characterization and minimization of all sources of background photons, including Raman generation in the nonlinear fiber and in the single-mode fiber, and leakage of pump photons.
Click here for more information about the all-fiber photon pair source.
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EEEL demonstrates linear optical sampling of high-speed optical signals with milliradian phase noise
The speed of optical communication networks continues to grow, and 40 Gb/s systems are being installed with plans for upgrade paths to 100 Gb/s. With higher data rates, the format of the data becomes more complicated as well. Phase shift-keying (PSK) allows increased spectral efficiency (data rate per spectral bandwidth) by encoding information on the optical phase of the transmitted light. As data rates grow beyond the speed of measurement electronics, there is a measurement challenge to be able to measure the phase and amplitude modulations at speeds beyond the reach of electronic detection alone.
Click here for more information about the linear optical sampling.
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